Reliability Analysis of Electrotechnical Devices

Tan, Cher Ming

Omschrijving

This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.
Gratis verzending vanaf
€ 19,95 binnen Nederland
Schrijver
Tan, Cher Ming
Titel
Reliability Analysis of Electrotechnical Devices
Uitgever
Mdpi AG
Jaar
2022
Taal
Engels
Pagina's
174
EAN
9783036546537
Bindwijze
Hardback

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