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Engels (1)
Prijs
Up To €10 (0) € 10 Tot € 20 (0) € 20 Tot € 50 (1) € 50 En Meer (0)
Auteur
Fearn, Sarah (1) Damsma, Gerrit (4) Vegt, Wim (4) Piper, H. Beam (3) Truant, Johnny B., Platt, Sean (3)
Verschijningsdatum
2015 (1)
Bindwijze
Overig (1)

Resultaat

Fearn, Sarah - An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Paperback
Fearn, Sarah
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
€ 47.50
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