Resultaat

Paperback
Fearn, Sarah
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
€ 47.50
Hardback
Fearn, Sarah (Imperial College, Shard, Alexander (National Physical Laboratory
Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)
€ 135.80
Boekstra