During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.
Ik heb een vraag over het boek: ‘High-Resolution X-Ray Scattering - Ullrich Pietsch, Vaclav Holy, Tilo Baumbach’.
Vul het onderstaande formulier in.
We zullen zo spoedig mogelijk antwoorden.
