Applied Measurement with jMetrik

Meyer, J. Patrick (University of Virginia, USA)

Omschrijving

"jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book"- Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.
€ 61,00
Paperback
 
Gratis verzending vanaf
€ 19,95 binnen Nederland
Schrijver
Meyer, J. Patrick (University of Virginia, USA)
Titel
Applied Measurement with jMetrik
Uitgever
Taylor & Francis Ltd
Jaar
2014
Taal
Engels
Pagina's
170
Gewicht
299 gr
EAN
9780415531979
Afmetingen
229 x 152 x 15 mm
Bindwijze
Paperback

U ontvangt bij ons altijd de laatste druk!


Rubrieken

Boekstra