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Applied Logistic Regression

Hosmer, David W. (University of Massachusetts, Lemeshow, Stanley (The Ohio State University (OSU), Sturdivant, Rodney X. (Center for Data Analysis and Statistics at the United States Military Academy in West Point

Omschrijving

This new edition provides a focused introduction to the LR model and its use in methods for modeling the relationship between a dichotomous outcome variable and a set of covariables.

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Schrijver: Hosmer, David W. (University of Massachusetts, Lemeshow, Stanley (The Ohio State University (OSU), Sturdivant, Rodney X. (Center for Data Analysis and Statistics at the United States Military Academy in West Point
Titel: Applied Logistic Regression
Uitgever: John Wiley & Sons Inc

Jaar: 2013
Taal: Engels
Pagina's: 528
Gewicht: 882 gr

EAN: 9780470582473
Afmetingen: 242 x 164 x 31 mm
Bindwijze: Gebonden

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Applied Logistic Regression

Hosmer, David W. (University of Massachusetts, Lemeshow, Stanley (The Ohio State University (OSU), Sturdivant, Rodney X. (Center for Data Analysis and Statistics at the United States Military Academy in West Point

Omschrijving

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