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Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

Kumar, Ch Sateesh (University of Johannesburg, Singh, M. Muralidhar (Madanapalle Institute of Technology & Science, Krishna, Ram (NIT Jamshedpur - Advanced Materials Characterization

Omschrijving

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

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Schrijver: Kumar, Ch Sateesh (University of Johannesburg, Singh, M. Muralidhar (Madanapalle Institute of Technology & Science, Krishna, Ram (NIT Jamshedpur
Titel: Advanced Materials Characterization
Uitgever: Taylor & Francis Ltd

Jaar: 2024
Taal: Engels
Pagina's: 130
Gewicht: 238 gr

EAN: 9781032375113
Afmetingen: 156 x 234 x 11 mm
Bindwijze: Paperback / softback

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Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

Omschrijving

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