Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Ibe, Eishi H.

Omschrijving

This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.
Gratis verzending vanaf
€ 19,95 binnen Nederland
Schrijver
Ibe, Eishi H.
Titel
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Uitgever
John Wiley & Sons Inc
Jaar
2015
Taal
Engels
Pagina's
296
Gewicht
626 gr
EAN
9781118479292
Afmetingen
250 x 169 x 21 mm
Bindwijze
Hardback

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