This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Ik heb een vraag over het boek:
‘Introduction to Focused Ion Beam Nanometrology - Cox, David C.’.
Vul het onderstaande formulier in.
We zullen zo spoedig mogelijk antwoorden.
