Nanometrology Using Transmission Electron Microscopy

Vlad Stolojan

Omschrijving

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
Gratis verzending vanaf
€ 19,95 binnen Nederland
Schrijver
Vlad Stolojan
Titel
Nanometrology Using Transmission Electron Microscopy
Uitgever
Morgan & Claypool Publishers
Jaar
2015
Taal
Engels
Pagina's
85
Gewicht
159 gr
EAN
9781681740560
Afmetingen
254 x 178 x 6 mm
Bindwijze
Paperback

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