X-Ray Diffraction for Materials Research

From Fundamentals to Applications

Omschrijving

This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how
€ 101,70
Paperback / softback
 
Gratis verzending vanaf
€ 19,95 binnen Nederland
Schrijver
Lee, Myeongkyu
Titel
X-Ray Diffraction for Materials Research
Uitgever
Apple Academic Press Inc.
Jaar
2021
Taal
Engels
Pagina's
302
Gewicht
450 gr
EAN
9781774635933
Afmetingen
150 x 228 x 19 mm
Bindwijze
Paperback / softback

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