Name: Characterisation and Control of Defects in Semiconductors - Filip (Professor, University of Helsinki, Department of Physics, Finland) Tuomisto
Price: 189.5 EUR
Author: Filip (Professor, University of Helsinki, Department of Physics, Finland) Tuomisto
ISBN: 9781785616556

Characterisation and Control of Defects in Semiconductors

Filip (Professor, University of Helsinki, Department of Physics, Finland) Tuomisto

Omschrijving

This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.

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Schrijver: Filip (Professor, University of Helsinki, Department of Physics, Finland) Tuomisto
Titel: Characterisation and Control of Defects in Semiconductors
Uitgever: Institution of Engineering and Technology

Jaar: 2019
Taal: Engels
Pagina's: 596

EAN: 9781785616556
Bindwijze: Hardback

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Characterisation and Control of Defects in Semiconductors

Filip (Professor, University of Helsinki, Department of Physics, Finland) Tuomisto

Omschrijving

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