Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Basics of Imaging and Analysis

Omschrijving

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This title covers achievements in the field of STEM obtained with advanced technologies.
Gratis verzending vanaf
€ 19,95 binnen Nederland
Schrijver
Tanaka, Nobuo (Nagoya Univ
Titel
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Uitgever
Imperial College Press
Jaar
2014
Taal
Engels
Pagina's
616
Gewicht
1039 gr
EAN
9781848167896
Afmetingen
229 x 155 x 33 mm
Bindwijze
Hardback

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