Phase-Contrast and Dark-Field Imaging

Zabler, Simon

Omschrijving

The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.
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Zabler, Simon
Titel
Phase-Contrast and Dark-Field Imaging
Uitgever
Mdpi AG
Jaar
2019
Taal
Engels
Pagina's
146
EAN
9783038972846
Bindwijze
Paperback

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