With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.
Ik heb een vraag over het boek:
‘Thin Film Analysis by X-Ray Scattering - Birkholz, Mario (IHP Microelectronics’.
Vul het onderstaande formulier in.
We zullen zo spoedig mogelijk antwoorden.
