Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques. TOC:Introduction to Scanning Probe Microscopy.- Introduction to Scanning Tunneling Microscopy.- Force Microscopy.- Magnetic Force Microscopy and Related Techniques.- Other Members of the SPM Family.- Introduction to Artifacts in SPM.- Future Aspects of SPM. Two decades after its invention, scanning probe microscopy has become a widely used method in laboratories as diverse as industrial magnetic stor­ age development or structural biology. Consequently, the community of users ranges from biologists and medical researchers to physicists and engineers, all of them exploiting the unrivalled resolution and profiting from the relative simplicity of the experimental implementation. In recent years the authors have taught numerous courses on scanning probe microscopy, normally in combination with hands-on student experi­ ments. The audiences ranged from physics freshmen to biology post-docs and even high-school teachers. We found it of particular importance to cover not only the physical principles behind scanning probe microscopy but also ques­ tions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. With this book our intention is to provide a gen­ eral textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy labora­ tory. Introduction to Scanning Probe Microscopy 1(14) Overview 2(3) Basic Concepts 5(10) Local Probes 6(1) Scanning and Control 7(4) Vibrational Isolation 11(1) Computer Control and Image Processing 12(3) Introduction to Scanning Tunneling Microscopy 15(30) Tunneling: A Quantum-Mechanical Effect 16(3) Tersoff-Hamann Model 18(1) Instrumental Aspects 19(10) Tunneling Tips 19(2) Implementation in Different Environments 21(1) Operation Modes 21(5) Manipulation Modes 26(3) Resolution Limits 29(5) Imaging of Semiconductors 29(1) Imaging of Metals 30(1) Imaging of Layered Materials 31(1) Imaging of Molecules 32(1) Imaging of Insulators 33(1) Theoretical Estimates of Resolution Limits 33(1) Observation of Confined Electrons 34(7) Scattering of Surface State Electrons at Steps 34(2) Scattering of Surface State Electrons at Point Defects 36(1) Electron Confinement to Nanoscale Boxes 37(3) Summary of Dispersion Relations for Noble-Metal (111) Surfaces 40(1) Spin-Polarized Tunneling 41(3) Observation of the Kondo Effect and Quantum Mirage 44(1) Force Microscopy 45(52) Concept and Instrumental Aspects 45(6) Deflection Sensors: Techniques to Measure Small Cantilever Deflections 45(1) Spring Constants of Rectangular Cantilevers 46(3) Cantilever and Tip Preparation 49(1) Implementations of Force Microscopy 50(1) Relevant Forces 51(7) Short-Range Forces 51(1) Van der Waals Forces 52(1) Electrostatic Forces 53(2) Magnetic Forces 55(1) Capillary Forces 56(1) Forces in Liquids 57(1) Operation Modes in Force Microscopy 58(3) Contact Force Microscopy 61(12) Topographic Imaging 61(3) Lateral Resolution and Contact Area 64(1) Friction Force Microscopy 65(2) Atomic Friction Processes 67(3) Lateral Contact Stiffness 70(2) Velocity Dependence of Atomic Friction 72(1) Dynamic Force Microscopy 73(14) Modelling Dynamic Force Microscopy 74(2) High-Resolution Imaging 76(2) Spectroscopic Measurements 78(1) Kelvin Probe Microscopy 79(2) Dissipation Force Microscopy 81(6) Tapping Mode Force Microscopy 87(3) Principles of Operation 87(1) Phase Imaging 88(1) Non-Linear Effects 89(1) Further Modes of Force Microscopy 90(2) Force Resolution and Thermal Noise 92(5) MFM and Related Techniques 97(30) MFM Operation Modes 98(4) Tip-Sample Distance Control 98(3) Measurement of Magnetic Forces 101(1) Contrast Formation 102(22) Introduction 102(2) Stray Fields of Simple Micromagnetic Structures 104(4) Negligible Modifications 108(7) Reversible Modifications 115(4) Irreversible Modifications 119(2) Separation of Topography and Magnetic Signal 121(3) Magnetic Resonance Force Microscopy 124(3) Other Members of the SPM Family 127(26) Scanning Near-Field Optical Microscopy (SNOM) 127(5) Scanning Near-Field Acoustic Microscopy (SNAM) 132(1) Scanning Ion Conductance Microscopy (SICM) 133(2) Photoemission Microscopy with Scanning Aperture (PEMSA) 135(1) STM with Inverse Photoemission (STMiP) 135(1) Laser Scanning Tunneling Microscopy (LSTM) 136(1) Electrochemical Scanning Tunneling Microscopy (ECSTM) 137(2) Scanning Thermal Microscopy (SThM) 139(2) Scanning Noise Microscopy (SNM) 141(1) Scanning Tunneling Potentiometry (SPotM) 142(1) Scanning Capacitance Microscopy (SCM) 142(4) Scanning Spreading Resistance Microscopy (SSRM) 146(4) Scanning Tunneling Atom Probe (STAP) 150(3) Artifacts in SPM 153(20) Tip Artifact: Convolution with Tip Shape 153(7) Influence of Local Inhomogeneities on Topography 160(3) STM Topography 160(1) SFM Topography 161(2) Influence of Topography on Local Measurements 163(4) STM-Induced Photon Emission 164(1) Lateral Force Measurement 165(2) Instrumental Artifacts 167(6) Piezoelectric Hysteresis, Scanner Creep, Non-Linearities and Calibration Errors 167(2) Tip Crashes, Feedback Oscillations, Noise, Thermal drift 169(1) Interference Patterns with Beam Deflection SFM 170(3) Prospects for SPM 173(8) Parallel Operation of SFM Cantilever Arrays 173(2) Novel Sensors Based on Cantilevers 175(3) Gravimetric Sensors 176(1) Calorimeter Sensors 176(1) Surface Stress Sensors 176(1) Cantilever Array Sensors 177(1) Molecular Electronics 178(1) Laboratory on a Tip 179(1) Local Modification Experiments 179(2) References 181(26) Index 207