Theory And Methods Of Photovoltaic Material Characterization: Optical And Electrical Measurement Techniques

Optical and Electrical Measurement Techniques

Omschrijving

This book provides an extensive review of the theory of transport and recombination properties in semiconductors. The emphasis is placed on electrical and optical techniques. There is a presentation of the latest experimental and theoretical techniques used to analyze minority-carrier lifetime. The relevant hardware and instrumentation are described. The newest techniques of lifetime mapping are presented. The issues are discussed relating to effects that mask carrier lifetime in certain device structures. The discrepancy between photoconductive and photoluminescence measurement results are analyzed.
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Schrijver
Ahrenkiel, Richard K (Lakewood Semiconductors, Ahrenkiel, S Phillip (South Dakota School Of Mines & Technology
Titel
Theory And Methods Of Photovoltaic Material Characterization: Optical And Electrical Measurement Techniques
Uitgever
World Scientific Publishing Co Pte Ltd
Jaar
2019
Taal
Engels
Pagina's
326
Gewicht
603 gr
EAN
9789813277090
Afmetingen
229 x 152 x 19 mm
Bindwijze
Hardback

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